This paper presents the results of the analysis on the influence of different RMS calculation methods to the detection and characterization of voltage dips. The analytical calculation of measurement parameters for voltage dips and the systematic deviations in characterization due to the dip detection algorithms are discussed for the general RMS calculation methods, sliding window and half cycle methods.
Stochastic processes are carried out with different fault types, fault locations and event occurring instants in a real medium voltage network, an evaluation study is presented with the statistic results.